J. Cirne, R. Dormeval, et al.
J. Phys. IV France 134 (2006) 1061-1063
Feature in accumulation of microdefects in copper under shock-wave loadingA.V. Pavlenko, A.E. Shestakov, A.R. Nurgaleev and D.N. Kazakov
FSUE “RFNC-VNIITF”, PO Box 245, Snezhinsk, 456770 Chelyabinsk Region, Russia
Published online: 26 July 2006
The optical microscopy and X-ray diffraction methods were used to investigate distribution of micro-, and macro-defects in copper samples recovered after shock-wave loading. The electric gun GNUV was used to generate the shock wave. Sample loading dynamics was recovered by the free surface velocity measured based on the Doppler shift in the wavelength of the probe laser radiation. In-depth distribution of defects was compared for two modes of sample loading. In the first mode, samples were loaded by the shock wave whose amplitude was insufficient for spalling, which was initiated by the shock wave in the second mode.
© EDP Sciences 2006