J.-C. Gauthier, et al.
J. Phys. IV France 133 (2006) 957-962
X and time-resolved XUV emission of laser produced Xe and Kr plasmasS. Bastiani-Ceccotti1, S. Tzortzakis1, J.-R. Marquès1, N. Kontogiannopoulos1, L. Lecherbourg1, F. Thais2, I. Matsushima3, O. Peyrusse4 and C. Chenais-Popovics1
1 Laboratoire pour l'Utilisation des Lasers Intenses, CNRS UMR 7605, École Polytechnique, 91128 Palaiseau, France
2 CEA/DSM/SPAM, Centre d'Études de Saclay, 91191 Gif-sur-Yvette Cedex, France
3 National Institute of Advanced Industrial Science and Technology, Tsukuba 3058568, Japan
4 CELIA, UMR 5107, Université Bordeaux 1, CEA - CNRS, 33405 Talence, France
X and XUV spectra of Xe and Kr were measured in a gas jet irradiated by a 400 J energy, 1.5 ns duration laser pulse. Simultaneously, the plasma was diagnosed by electronic and ionic Thomson scattering. The XUV spectra were time-resolved with a differentially pumped streak camera. Experimental spectra are compared with simulations performed with a NLTE atomic physics model.
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