J. Phys. IV France
Volume 129, October 2005
Page(s) 169 - 172

J. Phys. IV France 129 (2005) 169-172

DOI: 10.1051/jp4:2005129036

Planar differential interferometry of the magnetic field measurements

C. Tyszkiewicz and T. Pustelny

Department of Optoelectronics, Institute of Physics, Silesian University of Technology, ul. Krzywoustego 2, Gliwice, Poland

This paper presents a planar differential interferometer which can be used to measure the magnetic field. Due to magnetic field interaction the refractive index of the cover layer is changed for the TM mode. In consequence, the propagation constant changes only for this mode, and the phase difference between the TE and TM modes depends on the intensity of the magnetic field. The influence of the optic and geometric parameters of the presented interferometer on the phase difference between varoius modes is discussed.

© EDP Sciences 2005