J. Phys. IV France 128 (2005) 71-76
CSD ceramic K(Ta,Nb)O3 thin films and their characterization by infrared spectroscopyV. Zelezný1, J. Bursík2 and P. Vanek1
1 Institute of Physics ASCR, Praha, Czech Republic
2 Institute of Inorganic Chemistry ASCR, Rez, Czech Republic
Potassium tantalate niobate (KTaNb O3, (KTN), where x = 0, 0.21, 0.36, 0.53, 0.74, 0.82, 0.86, and 1) thin films were prepared by chemical solution deposition (CSD) on Si (100) substrates. A homogeneous and stable sol was obtained by dissolving potassium, niobium and tantalum isobutoxides in absolute isobutanol, refluxing for 30min and adding diethanolamine as a modifier. The sol was deposited by spin coating. KTN perovskite films were successfully prepared only on substrates covered with Al2O3 "chemical" and KNbO3 seeding buffer layers, in other cases pyrochlore structure was preferred. Annealing temperature and heating regime were also important factors for film quality. The optimum final annealing temperature was 750C/5min. It was confirmed by powder X-ray diffraction that the prepared films have pseudocubic perovskite structure.
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