J. Phys. IV France
Volume 104, March 2003
Page(s) 239 - 242

J. Phys. IV France
104 (2003) 239
DOI: 10.1051/jp4:200300070

Depth-graded multilayers

Ch. Morawe1, J.-Ch. Peffen1 and I.V. Kozhevnikov2

1  European Synchrotron Radiation Facility, BP. 220, 38043 Grenoble cedex, France
2  Lebedev Physical Institute, Leninsky Prospect 53, 119991 Moscow, Russia

We present first expérimental results on the fabrication and characterization of depthgraded x-ray multilayers providing a broad and well-defined reflectivity profile. We have designed and deposited irregular multilayer structures providing a practically constant reflectivity of about 20% around the first Bragg-reflection and a bandwidth of about 20% in both incident angle and photon energy. Detailed numerical simulations allow for the détermination of residual errors in the layer stack.

© EDP Sciences 2003