J. Phys. IV France 104 (2003) 239
Depth-graded multilayersCh. Morawe1, J.-Ch. Peffen1 and I.V. Kozhevnikov2
1 European Synchrotron Radiation Facility, BP. 220, 38043 Grenoble cedex, France
2 Lebedev Physical Institute, Leninsky Prospect 53, 119991 Moscow, Russia
We present first expérimental results on the fabrication and characterization of depthgraded x-ray multilayers providing a broad and well-defined reflectivity profile. We have designed and deposited irregular multilayer structures providing a practically constant reflectivity of about 20% around the first Bragg-reflection and a bandwidth of about 20% in both incident angle and photon energy. Detailed numerical simulations allow for the détermination of residual errors in the layer stack.
© EDP Sciences 2003