J. Phys. IV France 11 (2001) Pr11-127-Pr11-131
Growth and characterization of LaMnO3/SrTiO3 bi-layerM. Pripko, A. Halabica, K. Fröhlich, A. Plecenik, V. Cambel, S. Chromik and D. Machajdik
Institute of Electrical Engineering, Slovak Academy of Sciences, Dubravska Cesta 9, 84239 Bratislava, Slovakia
We report about LaMnO3/SrTiO3 bi-layers deposited by using injection metal-organic chemical vapour deposition (MOCVD). We have studied structure of the bi-layers by X-ray diffraction and its surface by AFM. Properties of the LaMnO3/SrTiO3 interface in fabricated LaMnO3/SrTiO3/Au tunnel junction were investigated by tunneling measurements. Obtained results are discussed with regard to suitability of MOCVD grown SrTiO3 film as a matenal for tunnel junction barrier.
© EDP Sciences 2001