J. Phys. IV France 11 (2001) Pr11-65-Pr11-69
Pulsed laser deposition of PbMg1/3Nb2/3O3 thin films and PbMg1/3Nb2/3O3/PbTiO3 multilayersN. Lemée1, H. Bouyanfif1, J.L. Dellis1, M. El Marssi1, M.G. Karkut1, L. Dupont2, B. Dkhil3 and J.M. Kiat3
1 LPMC, Université de Picardie Jules Verne, 33 rue Saint Leu, 80039 Amiens, France
2 LRCS, Université Picardie Jules Verne, 33 rue Saint Leu, 80039 Amiens, France
3 SPMS, École Centrale de Paris, 92295 Châtenay-Malabry, France
We have fahricated epitaxial thin films of the relaxor Pb(Mg1/3Nb2/3)O3 (PMN) and multilayer structures of relaxor/ferroelectric Pb(Mg1/3Nb2/3)O3/PbTiO3 (PMN/PTO) using pulsed laser deposition. We present results obtained using reflection high energy electron diffraction (RHEED), x-ray diffraction (XRD) and transmission electron microscopy (TEM) on thin films of PMN grown on single crystal (100) SrTiO3 substrates using a stoichiometric PMN ceramic target and a PMN-2%Mg target. With the latter target we were able to produce pyrochlore free thin films. RHEED images 140Å PMN films consist of sharp lines and Kikuchi bands which indicate smooth surfaces. This is borne out by the observation of XRD Laue (thickness) oscillations. TEM images of PMN films with some pyrochlore show the PMN growth is columnar and the widths are on the order of 400Å. Multilayer structures of (PMNΛ/2 /PTOΛ/2)4 (Λ is the modulation period) were sucessfully grown. Satellite peaks were observed for these quadrilayer structures and preliminary analysis indicates that for the majority of the tetragonal PTO layers are oriented with the c-axis in the plane of the film.
© EDP Sciences 2001