J. Phys. IV France
Volume 10, Numéro PR7, May 2000
International Workshop on Dynamics in Confinement
Page(s) Pr7-119 - Pr7-122
International Workshop on Dynamics in Confinement

J. Phys. IV France 10 (2000) Pr7-119-Pr7-122

DOI: 10.1051/jp4:2000724

Dielectric response of ferroelectric liquid crystal thin layer

I. Rychetský, N. Novotná and M. Glogarová

Institute of Physics, Academy of Sciences of the Czech Republic, Na Slovance 2, 18221 Prague, Czech Republic

In the thin layer of the SmC* phase the unwound twisted structure or the helical structure with the dechiralization lines can appear depending on the layer thickness and the sample processing. The thickness dependent dielectric response of both structures is calculated and compared. Within the model considered, the experimentally observed slower relaxation dynamics of the twisted structure as compared to the helical structure, is caused by the existence of weak depolarization fields.

© EDP Sciences 2000