J. Phys. IV France 7 (1997) C2-243-C2-244
XAFS - A Data Analysis Program for Materials ScienceM. Winterer
Thin Films Division, Materials Science Department, Technical University Darmstadt, Petersenstr 23 64287 Darmstadt, Germany
A new program is presented for the data analysis of XAFS. Comprehensive methods are available for the analysis of disordered systems.
© EDP Sciences 1997