J. Phys. IV France 7 (1997) C2-827-C2-828
XAFS Study of the Main Constituent Elements of Layered AluminosilicatesM.A. Castro, M.D. Alba, R. Alvero, A.I. Becerro, A. Muñoz-Páez and J.M. Trillo
Departamento de Química Inorgánica, Instituto de Ciencia de Materiales, Universidad de Sevilla, CSIC, P. O. Box 874, 41080 Sevilla, Spain
Changes in the Si and Al K-edges XANES signals for a series of well characterized phyllosilicates have been examined. Results obtained for the different specimens have been interpreted in accordance with the changes in the structural compositions of the minerals and with the results of previous theoretical and experimental studies of related compounds. In both edges appear typical features that can be associated with dioctahedral and trioctahedral series.
© EDP Sciences 1997