Numéro
J. Phys. IV France
Volume 7, Numéro C2, Avril 1997
Proceedings of the 9th International Conference on X-Ray Absorption Fine Structure
Page(s) C2-1011 - C2-1012
DOI https://doi.org/10.1051/jp4:19972120
Proceedings of the 9th International Conference on X-Ray Absorption Fine Structure

J. Phys. IV France 7 (1997) C2-1011-C2-1012

DOI: 10.1051/jp4:19972120

High-Pressure High-Temperature XAFS Investigation on HgTe

Y. Katayama1, M. Mezouar2, J.P. Itié2, J.M. Besson2, G. Syfosse3, P. Le Fèvre4 and A. Di Cicco5

1  Department of Physics, Faculty of Science and Technology, Keio University, 3-14-1 Hiyoshi, Kohoku-ku, Yokohama 223, Japan
2  Physique des Milieux Condensés, Université Pierre et Marie Curie, BP. 77, 4 place Jussieu, 75252 Paris cedex 05, France
3  Département des Hautes Pressions, Université Pierre et Marie Curie, BP. 77, 4 place Jussieu, 75252 Paris cedex 05, France
4  LURE and CEA, SRSIN, 91191 Gif-sur-Yvette cedex, France
5  Dipartimento di Matematica e Fisica, Universitá degli Studi di Camerino, Via Madonna delle Carceri, 62032 Camerino (MC), Italy


Abstract
X-ray absorption measurements at the L3 edge of Hg in solid and liquid HgTe have been performed under high-temperature and high-pressure up to 1000 K and 3 GPa using a large volume Paris-Edinburgh press. EXAFS spectra have been analyzed with GNXAS approach. The pressure dependencies of the nearest neighbor distance and the bond variance at room temperature as well as their variation with temperature at 0.6 GPa have been obtained. The temperature dependence of the bond variance has been fitted to the Einstein model and is consistent to the decrease of the bulk modulus with increasing temperature, which has recently been shown to occur by an x-ray diffraction study.



© EDP Sciences 1997

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