J. Phys. IV France 7 (1997) C2-705-C2-706
Soft X-Ray Absorption Spectroscopy with Variable Surface Sensitivity using Fluorescence Yield DetectionY. Kitajima
Photon Factory, National Laboratory for High Energy Physics, 1-1 Oho, Tsukuba, Ibaraki 305, Japan
Surface sensitivity in the soft X-ray absorption spectroscopy by the fluorescent X-ray yield detection under grazing exit condition is discussed. It is experimentally demonstrated at Si K-edge that the sampling depth can be controlled by changing exit angles in the vicinity of the critical angle for total reflection.
© EDP Sciences 1997