Proceedings of the 43rd International Field Emission Symposium
J. Phys. IV France 06 (1996) C5-125-C5-128
Single Atom Electron Emission from the Silicon Tip Coated by Calcium Fluoride with Samarium Dopant IonsV.N. Konopsky, S.K. Sekatskii and V.S. Letokhov
Institute of Spectroscopy, 142092 Troitsk, Moscow Region, Russia
We present the first experimental results of the studying of field electron emission from sharp silicon tips covered by thin dielectric CaF2 layers containing Sm dopant ions. Some indications on the resonant tunneling of electrons from sharp silicon tip through dopant samarium ions inside the coating have been observed, which can be regarded as an implementation of one-atom electron source of a new type, based on dielectric coating of emitting tip.
© EDP Sciences 1996