J. Phys. IV France 05 (1995) C5-927-C5-934
HREM Characterization of Interfaces in Thin MOCVD Superconducting FilmsD. Dorignac1, S. Schamm1, Ch. Grigis1, J. Santiso2, G. Garcia3 and A. Figueras2
1 CNRS/CEMES-LOE, MEA, BP. 4347, 31055 Toulouse, France
2 CSIC/ICMAB, Campus UAB, 08193 Bellaterra, Spain
3 S.E. CARBUROS METALICOS, Pg Zona Franca 14, 08038 Barcelona, Spain
This paper is concerned with high-Tc, superconducting compounds produced by metal-organic chemical vapour deposition. The nanostructure of different types of interfaces - yttria stabilized zirconia buffer / (1-102)-sapphire substrate, YBa2Cu3O7-x film / Y2O3 precipitates as well as YBa2Cu3O7-x film / (001)-NdGaO3, -SrTiO3, and -MgO substrates - has been investigated by high resolution electron microscopy. The orientation relationships and the corresponding layer sequences across the interfaces have been determined with the aid of computer simulations.
© EDP Sciences 1995