J. Phys. IV France 04 (1994) C9-265-C9-268
Interests of synchrotron radiation for internal stress analysisJ.L. Lebrun, P. Gergaud, V. Ji and M. Belassel
ENSAM, LM3, URA 1219 du CNRS, 151 Bd. de L'Hôpital, 75013 Paris, France
The interest of the method of X-ray diffraction for residual stress measurement is in continuous progress due to the advances in theoretical research and the development of new equipment. Usually, the shift and broadening of a diffraction peak reveal respectively the macrostrain (or stress) and microstrain. The limits of the X-ray provided by classical tubes in laboratory are its low intensity, fixed wavelength and relatively poor optic and spectrum resolution. This paper is a review of the use and interest of the synchrotron radiation in internal stress or strain analysis.
© EDP Sciences 1994