8 ITMP3 / 8éme conférence internationale de photoacoustique et photothermique
J. Phys. IV France 04 (1994) C7-191-C7-194
Probing electron induced defects in CaF2 by photothermal displacementM. Reichling, R. Bennewitz and E. Matthias
Fachbereich Physik, Freie Universität Berlin, Arnimallee 14, 14195 Berlin, Germany
The surface displacement technique is used to measure the temperature and frequency dependence of the periodic expansion of a CaF2-surface subject to a modulated focused beam of 1keV electrons. Theoretical models are presented for a prediction of the observed phenomena based on thermal transport and defect lifetime effects. The use of such investigations for the study of thermal and non-thermal transport phenomena in alkaline-earth halides is discussed.
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