8 ITMP3 / 8éme conférence internationale de photoacoustique et photothermique
J. Phys. IV France 04 (1994) C7-95-C7-98
Photothermal frequency-domain depth profilometry of a discrete inhomogeneous surface layer on homogeneous substrateF. Funak, A. Mandelis and M. Munidasa
Photothermal and Optoelectronic Diagnostics Laboratory, Department of Mechanical Engineering and Manufacturing Research Corporation of Ontario, University of Toronto, Toronto, Ont. Canada, M5S 1A4
A technique for obtaining thermal diffusivity depth profiles of inhomogeneities in two-layered systems is discussed. The method uses incremental differences in the photothermal signal frequency response of a sample with the inhomogeneous surface layer compared to a homogeneous reference sample. Applications to machined steel samples are reported.
© EDP Sciences 1994