8 ITMP3 / 8éme conférence internationale de photoacoustique et photothermique
J. Phys. IV France 04 (1994) C7-705-C7-708
Ultrafast stress pulse detection by laser beam deflectionO.B. Wright1 and T. Hyoguchi2
1 Consiglio Nazionale delle Ricerche (CNR), Istituto di Acustica "O.M. Corbino", Via Cassia 1216, 00189 Roma, Italy
2 Electronics Research Laboratories, Nippon Steel Corporation, 5-10-1 Fuchinobe, Sagamihara, Kanagawa 229, Japan
We describe a direct method for the detection of optically excited ultrashort stress pulses in thin films using a time-resolved pump and probe scheme. Changes in the surface profile are monitored by the angular deflection of a probe beam. Application to the detection of interfacial layers is also demonstrated.
© EDP Sciences 1994