Numéro
J. Phys. IV France
Volume 04, Numéro C4, Avril 1994
3rd International Conference Laser M2P
Page(s) C4-639 - C4-642
DOI http://dx.doi.org/10.1051/jp4:19944170
3rd International Conference Laser M2P

J. Phys. IV France 04 (1994) C4-639-C4-642

DOI: 10.1051/jp4:19944170

Application of diode lasers for analysis

C. SCHNÜRER-PATSCHAN1, H. GROLL1, A. ZYBIN2 and K. NIEMAX1, 3

1  Institut für Spektrochemie und Angewandte Spektroskipie, Dortmund, Germany
2  Institute of Spectroscopy, Russian Academy of Sciences, Troitzk, Russia
3  Institut für Physik, Universität Hohenheim, Stuttgart, Germany


Abstract
Applications of semiconductor diode lasers to element analysis by laser atomic absorption spectrometry, isotope selective Doppler-free spectroscopy and laser induced fluorescence are discussed.



© EDP Sciences 1994