Numéro
J. Phys. IV France
Volume 04, Numéro C2, Février 1994
European Workshop on Piezoelectric Materials : Crystal Growth, Properties and Prospects
Page(s) C2-53 - C2-60
DOI http://dx.doi.org/10.1051/jp4:1994207
European Workshop on Piezoelectric Materials : Crystal Growth, Properties and Prospects

J. Phys. IV France 04 (1994) C2-53-C2-60

DOI: 10.1051/jp4:1994207

Use of image treatment for the understanding of the influence of crystal defects in piezoelectric materials

M. PILARD1, Y. EPELBOIN1, B. CAPELLE1, J. DETAINT2, J. SCHWARTZEL2 and A. ZARKA1

1  Laboratoire de Minéralogie-Cristallographie, Université P. et M. Curie et D. Diderot, Associé au C.N.R.S., case 115, 75252 Paris cedex 05, France
2  France Telecom CNET, Département PAB/BAG/MCT/CRL, 92220 Bagneux, France


Abstract
The propagation of surface or bulk acoustic waves in piezoelectric materials has been studied using the time structure of synchrotron X-ray beam. A precise state of vibration may be frozen in a stroboscopic topograph. The analysis of such images may be difficult since crystal defects induce highly contrasted areas which mask interesting details. Numerical image treatment give very efficient solutions to extract this "hidden" information. Fourier filtering is one of the methods and has been applied to the topographs, to study the interaction of the defects with the acoustic waves.



© EDP Sciences 1994