Numéro
J. Phys. IV France
Volume 03, Numéro C8, Décembre 1993
IX International Conference on Small Angle Scattering
Page(s) C8-463 - C8-466
DOI http://dx.doi.org/10.1051/jp4:1993896
IX International Conference on Small Angle Scattering

J. Phys. IV France 03 (1993) C8-463-C8-466

DOI: 10.1051/jp4:1993896

SAXS study of coated porous silicas

A. BENEDETTI1, S. CICCARIELLO2, F. PINNA3 and G. STRUKUL3

1  Dipartimento di Chimica-Fisica, Calle S. Marta DD2137, 30123 Venezia, Italy
2  Dipartimento di Fisica 'G. Galilei' and sez. INFM, via Manolo 8, 35131 Padova, Italy
3  Dipartimento di Chimica Industriale, Calle S. Marta DD2137, 30123 Venezia, Italy


Abstract
The small-angle x-ray intensities scattered (SAXS) by four reversed phase silica (RPS) samples are analyzed. The RPS's have been obtained by coating two different porous silica supports with dimethyloctyl- and with dimethyloctadecyl-(chloro)silane. From the observed intensities it is possible to estimate the mean electron-densities of the films as well as the mean silica-surface per coating molecule.



© EDP Sciences 1993