Numéro
J. Phys. IV France
Volume 03, Numéro C8, Décembre 1993
IX International Conference on Small Angle Scattering
Page(s) C8-341 - C8-344
DOI http://dx.doi.org/10.1051/jp4:1993869
IX International Conference on Small Angle Scattering

J. Phys. IV France 03 (1993) C8-341-C8-344

DOI: 10.1051/jp4:1993869

Microstructure of nanostructured amorphous Si-Au-alloys

A. STURM and A. WIEDENMANN

Hahn-Meitner-Institut Berlin GmbH, AG N5, Glienicker Str. 100, 1000 Berlin 39, Germany


Abstract
Small Angle Neutron Scattering (SANS) was employed to characterize the microstructure of nanostructured amorphous Si1-XAuX-alloys (0.1<x<0.3) produced by an inert-gas condensation and in-situ consolidation technique. Amorphous grains are embedded in a matrix of lower density, formed by grain boundaries and free volumes. The relative densities were found to be dependent on the average particle sizes and volume fractions, but independent of the alloy composition. In all samples the SANS intensity decreases according to a power law ~Q-3.37 at low Q, which is attributed to a surface fractal structure of dimension DS=2.63.



© EDP Sciences 1993