Numéro
J. Phys. IV France
Volume 03, Numéro C7, Novembre 1993
The 3rd European Conference on Advanced Materials and Processes
Troisiéme Conférence Européenne sur les Matériaux et les Procédés Avancés
Page(s) C7-481 - C7-484
DOI http://dx.doi.org/10.1051/jp4:1993778
The 3rd European Conference on Advanced Materials and Processes
Troisiéme Conférence Européenne sur les Matériaux et les Procédés Avancés

J. Phys. IV France 03 (1993) C7-481-C7-484

DOI: 10.1051/jp4:1993778

Influence of purity level on the microstructure and some properties of γ Ti-Al intermetallics

C. DIMITROV, J.-L. PASTOL, J. BIGOT and O. DIMITROV

CECM, CNRS, 15 rue Georges Urbain, 94407 Vitry-sur-Seine cedex, France


Abstract
The dependence of microstructure, hardness and electrical resistivity on the purity of TiAl alloys with 50, 53 and 56 at.% Al was investigated by comparing materials prepared from high-purity metals by clean processing methods, to materials prepared from commercial metals. Grain size and resistivity were found to depend both on purity and on Al content, whereas hardness varied little with the overall purity, in the investigated range.



© EDP Sciences 1993