Troisiéme Conférence Européenne sur les Matériaux et les Procédés Avancés
J. Phys. IV France 03 (1993) C7-2137-C7-2142
Local texture measurements with the scanning electron microscopeG. GOTTSTEIN and O. ENGLER
Institut für Metallkunde und Metallphysik, RWTH Aachen, Kopernikusstr. 14, 5100 Aachen, Germany
Techniques for convenient measurement of the crystallographic orientation of small volumes in bulk samples by electron diffraction in the SEM are discussed. They make use of Selected Area Electron Channelling Patterns (SAECP) and Electron Back Scattering Patterns (EBSP). The principle of pattern formation as well as measuring and evaluation procedure are introduced. The methods offer a viable procedure for obtaining information on the spatial arrangement of orientations, i.e. on orientation topography. Thus, they provide a new level of information on crystallographic texture. An application of the techniques for local texture measurements is demonstrated by an example, namely for investigation of considering the recrystallization behaviour of binary Al-1.3%Mn with large precipitates. Finally, further developments of the EBSP technique are addressed.
© EDP Sciences 1993