Troisiéme Conférence Européenne sur les Matériaux et les Procédés Avancés
J. Phys. IV France 03 (1993) C7-2099-C7-2104
Recent developments in X-ray projection microscopy and X-ray microtomography applied to materials scienceJ. CAZAUX, D. ERRE, D. MOUZE, J.M. PATAT, S. RONDOT, A. SASOV, P. TREBBIA and A. ZOLFAGHARI
LASSI, GRSM, Faculté des Sciences, BP. 347, 51062 Reims, France
After a long period of sleeping, there is recently a spectacular revival of X-ray microscopy due to the progress in X-ray sources (synchrotron radiation), X-ray optics, and X-ray detectors. However most of the attempts in this field concern the use of soft X-rays to observe, with an improved resolution, biological specimens in their wet environment. In opposition to these trends, we try to demonstrate in this paper the interest of using X-ray microscopy to materials science by applying the old principle of shadow microscopy (but with modern detectors such as CCD cameras) with harder X-rays. The excellent linearity, speed of acquisition and large dynamic of CCD cameras combined to the intrinsic advantage of X-rays "to see" inside thick specimens allows one to obtain digital images (for quantification), to follow dynamic processes (such as solid /solid diffusion) and to perform 3 - dimensional reconstruction of the object by X-ray microtomography. The performance of this renewed technique is indicated and illustrated by various examples.
© EDP Sciences 1993