Numéro
J. Phys. IV France
Volume 03, Numéro C7, Novembre 1993
The 3rd European Conference on Advanced Materials and Processes
Troisiéme Conférence Européenne sur les Matériaux et les Procédés Avancés
Page(s) C7-2099 - C7-2104
DOI http://dx.doi.org/10.1051/jp4:19937334
The 3rd European Conference on Advanced Materials and Processes
Troisiéme Conférence Européenne sur les Matériaux et les Procédés Avancés

J. Phys. IV France 03 (1993) C7-2099-C7-2104

DOI: 10.1051/jp4:19937334

Recent developments in X-ray projection microscopy and X-ray microtomography applied to materials science

J. CAZAUX, D. ERRE, D. MOUZE, J.M. PATAT, S. RONDOT, A. SASOV, P. TREBBIA and A. ZOLFAGHARI

LASSI, GRSM, Faculté des Sciences, BP. 347, 51062 Reims, France


Abstract
After a long period of sleeping, there is recently a spectacular revival of X-ray microscopy due to the progress in X-ray sources (synchrotron radiation), X-ray optics, and X-ray detectors. However most of the attempts in this field concern the use of soft X-rays to observe, with an improved resolution, biological specimens in their wet environment. In opposition to these trends, we try to demonstrate in this paper the interest of using X-ray microscopy to materials science by applying the old principle of shadow microscopy (but with modern detectors such as CCD cameras) with harder X-rays. The excellent linearity, speed of acquisition and large dynamic of CCD cameras combined to the intrinsic advantage of X-rays "to see" inside thick specimens allows one to obtain digital images (for quantification), to follow dynamic processes (such as solid /solid diffusion) and to perform 3 - dimensional reconstruction of the object by X-ray microtomography. The performance of this renewed technique is indicated and illustrated by various examples.



© EDP Sciences 1993