Numéro
J. Phys. IV France
Volume 03, Numéro C7, Novembre 1993
The 3rd European Conference on Advanced Materials and Processes
Troisiéme Conférence Européenne sur les Matériaux et les Procédés Avancés
Page(s) C7-2083 - C7-2092
DOI http://dx.doi.org/10.1051/jp4:19937332
The 3rd European Conference on Advanced Materials and Processes
Troisiéme Conférence Européenne sur les Matériaux et les Procédés Avancés

J. Phys. IV France 03 (1993) C7-2083-C7-2092

DOI: 10.1051/jp4:19937332

Electron energy-loss spectroscopy (EELS) ; comparison with X-ray analysis

H. MÜLLEJANS and J. BRULEY

Max-Planck-Institut für Metallforschung, Institut für Werkstoffwissenschaft, Seestrasse 92, 70174 Stuttgart, Germany


Abstract
Analytical electron microscopy offers two main techniques of interest to materials science : electron energy-loss spectroscopy (EELS) and energy-dispersive x-ray analysis (EDX). The scientist is confronted with the choice of one of the two for the problem under consideration, although it is possible to employ both simultaneously. It is therefore important to know what to expect from each of the two techniques to assess which one is more likely to yield the desired information. Here both are compared to provide help in making that decision. The various aspects are illustrated with recent applications of both techniques in the research on interfaces in ceramics. Emphasis is put on the analysis of additional information contained in EELS, because this contributes to the understanding of bonding and chemistry inside the specimen.



© EDP Sciences 1993