Numéro
J. Phys. IV France
Volume 03, Numéro C7, Novembre 1993
The 3rd European Conference on Advanced Materials and Processes
Troisiéme Conférence Européenne sur les Matériaux et les Procédés Avancés
Page(s) C7-2063 - C7-2072
DOI http://dx.doi.org/10.1051/jp4:19937330
The 3rd European Conference on Advanced Materials and Processes
Troisiéme Conférence Européenne sur les Matériaux et les Procédés Avancés

J. Phys. IV France 03 (1993) C7-2063-C7-2072

DOI: 10.1051/jp4:19937330

Holography and transmission electron microscopy

G. MATTEUCCI1, G. POZZI2 and A. TONOMURA3

1  Department of Physics, University of Bologna, via Irnerio 46, 40126 Bologna, Italy
2  Department of Materials Science, University of Lecce, via Arnesano, 73100 Lecce, Italy
3  Advanced Research Laboratory, Hitachi Ltd., Hatoyama, Saitama 350-03, Japan


Abstract
The basic principles and methods of off-axis electron holography are presented and illustrated by means of three examples related to its application in high resolution electron microscopy and the investigation of electric and magnetic fields in thin specimens.



© EDP Sciences 1993