Numéro
J. Phys. IV France
Volume 03, Numéro C7, Novembre 1993
The 3rd European Conference on Advanced Materials and Processes
Troisiéme Conférence Européenne sur les Matériaux et les Procédés Avancés
Page(s) C7-41 - C7-48
DOI http://dx.doi.org/10.1051/jp4:1993704
The 3rd European Conference on Advanced Materials and Processes
Troisiéme Conférence Européenne sur les Matériaux et les Procédés Avancés

J. Phys. IV France 03 (1993) C7-41-C7-48

DOI: 10.1051/jp4:1993704

Scanning tunneling microscopy

J.K. GIMZEWSKI

IBM Research Division, Zurich Research Laboratory, Säumerstr. 4, 8803 Rüschlikon, Switzerland


Abstract
A brief review of the state-of-the-art of scanning tunneling microscopy (STM) is presented with emphasis on materials problems. I shall discuss in particular the variety of materials, environrnents and temperatures that can be investigated. In addition to topographie studies, some examples of STM as local probe are given. It is proposed that STM be increasingly incorporated as a technique for investigation of real materials problems.



© EDP Sciences 1993