J. Phys. IV France 03 (1993) C4-193-C4-195
Characterization of porous silicon by positron annihilationY. ITOH1, H. MURAKAMI2 and A. KINOSHITA3
1 The Institute of Physical and Chemical Research (RIKEN), Hirosawa, Wako-shi, Saitama 351-01, Japan
2 Department of Physics, Faculty of Education, Tokyo Gakugei University, Koganei-shi, Tokyo 184, Japan
3 Faculty of Science and Engineering, Tokyo Denki University, Hatoyama, Saitama 350-03, Japan
Characterization of porous silicon was performed by means of positron annihilation. Three components of the positron lifetime were observed, one of which was extremely long. The Doppler-broadened spectrum was sharp compared with that of crystal silicon, and became even narrower in an applied magnetic field. These results show that the porous structure is the cause of positronium formation in porous silicon.
© EDP Sciences 1993