Numéro
J. Phys. IV France
Volume 01, Numéro C7, Décembre 1991
2nd International Conference
Laser M2P
Page(s) C7-685 - C7-688
DOI http://dx.doi.org/10.1051/jp4:19917184
2nd International Conference
Laser M2P

J. Phys. IV France 01 (1991) C7-685-C7-688

DOI: 10.1051/jp4:19917184

MATERIAL ANALYSIS AND SURFACE INTERACTION STUDIES USING LASER RESONANT MULTIPHOTON IONIZATION

T. GIBERT1, P. PEZÉ1, B. DUBREUIL1, M.F. BARTHE2 and J.L. DEBRUN2

1  GREMI, Université d'Orléans, CNRS, F-45067 Orléans cedex 2, France
2  CERI, CNRS, rue de la Ferollerie, F-45071 Orléans cedex 2, France


Abstract
Resonance Ionization Spectroscopy (RIS) technique is an ultrasensitive method of detection of atoms and molecules. Application of RIS to material analysis requires an atomization step which is based in our set-up on ion beam sputtering. We present a review of the analytical studies we have performed demonstrating the very attractive potentialities of this method. RIS can be also used to study the surface sputtering process itself. Basic mechanisms of low energy laser desorption and vaporisation of metal samples have been investigated in this way.



© EDP Sciences 1991