EDP Sciences Journals List
Issue J. Phys. IV France
Volume 10, Number PR6, April 2000
The Sixth Japan-France Materials Science Seminar
JFMSS-6
Microstructural Design for Improved Mechanical Behaviour of Advanced Materials
Page(s) Pr6-131 - Pr6-135
DOI http://dx.doi.org/10.1051/jp4:2000623

The Sixth Japan-France Materials Science Seminar
JFMSS-6
Microstructural Design for Improved Mechanical Behaviour of Advanced Materials

J. Phys. IV France 10 (2000) Pr6-131-Pr6-135

DOI: 10.1051/jp4:2000623

Electron diffraction (LACBED) and HRTEM Moiré fringe pattern study of stress in YBaCuO thin film on Mg0

F. Pailloux and R.J. Gaboriaud

LMP, SP2M1, Téléport 2, boulevard Marie et Pierre Curie, BP. 30179, 86962 Futuroscope cedex, France


Abstract
Epitaxial stresses are studied by means of Large Angle Convergent Beam Electron Diffraction technique and Moiré fringe pattern obtained by High Resolution Transmission Electron Microscopy in pulsed laser deposited thin films of YBaCuO on MgO substrate. Grains with their c-axis parallel to the interface (c//) grow from the substrate up to the outer surface of the film. The c// grains, embedded in the c ⊥ host matrix, are studied from investigations of cross-sectional sample, by both LACBED performed on the MgO substrate just beneath the different orientations of the thin film, and by the Moiré fringe pattern obtained by tilting the interface of the sample. The broadening of the Bragg lines present in the LACBED disk together with the direction of the Moiré fringes, clearly indicate that the c// oriented grains embedded in a c ⊥ oriented YBaCuO matrix are under stress.



© EDP Sciences 2000