EDP Sciences Journals List
Issue J. Phys. IV France
Volume 7, Number C2, Avril 1997
Proceedings of the 9th International Conference on X-Ray Absorption Fine Structure
Page(s) C2-31 - C2-38
DOI http://dx.doi.org/10.1051/jp4/1997005

Proceedings of the 9th International Conference on X-Ray Absorption Fine Structure

J. Phys. IV France 7 (1997) C2-31-C2-38

DOI: 10.1051/jp4/1997005

X-Ray Absorption Spectroscopy under Extreme Conditions

J.P. Itié1, A. Polian2, D. Martinez3, V. Briois3, A. Di Cicco1, A. Filipponi4 and A. San Miguel4

1  Dipartimento di Matematica e fisica, Universita di Camerino, 62032 Camerino, Italy
2  Physique des Milieux Condensés, Université Paris VI, T 13 E4, 4 place Jussieu, B.P. 77, 75230 Paris cedex 05, France
3  LURE, Université Paris-Sud, Bat 209 D, 91405 Orsay cedex, France
4  ESRF.BP. 220, 38043 Grenoble cedex, France


Abstract
The possibilities given by XAS for structural determination under extreme conditions are discussed through the example of HgTe which exhibits three phase transition below 20 GPa. All of the structures have been determined or corroborated using EXAFS analysis and XANES simulations. Pressure induced amorphization (berlinites) or crystallization (amorphous Ge and liquid Kr) can be followed by XAS before and after the transition. Future developments related to the new generation of synchrotron radiation sources are presented.



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